Aristo Chen a06733fc83 binman: Fix FIT image overlap issues for testFitSplitElf
Fix one binman test that has memory region overlap issue, the test case
needed to be updated to use non-overlapping memory layouts.

* Tests fixed:
  - testFitSplitElf

* Changes made:
  1. ELF section layouts: added elf_sections_tee.lds with different
     address for TEE to avoid overlap with ATF address defined in
     elf_sections.lds
  2. Makefile to properly build elf_sections_tee binary
  3. Updat ftest.py to use separate ELF files for TEE vs ATF components
     in split-elf operations.

An upcoming commit will validate if the memory region is overlapped

Signed-off-by: Aristo Chen <aristo.chen@canonical.com>
2025-09-23 13:35:22 -06:00
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