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	The test flags used by driver model are currently not available to other tests. Rather than creating two sets of flags, make these flags generic by changing the DM_ prefix to UT_ and moving them to the test.h header. This will allow adding other test flags without confusion. Signed-off-by: Simon Glass <sjg@chromium.org>
		
			
				
	
	
		
			34 lines
		
	
	
		
			779 B
		
	
	
	
		
			C
		
	
	
	
	
	
			
		
		
	
	
			34 lines
		
	
	
		
			779 B
		
	
	
	
		
			C
		
	
	
	
	
	
| // SPDX-License-Identifier: GPL-2.0+
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| /*
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|  * Copyright 2018 Google LLC
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|  * Written by Simon Glass <sjg@chromium.org>
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|  */
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| 
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| #include <common.h>
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| #include <dm.h>
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| #include <i2s.h>
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| #include <asm/test.h>
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| #include <dm/test.h>
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| #include <test/test.h>
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| #include <test/ut.h>
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| 
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| /* Basic test of the i2s codec uclass */
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| static int dm_test_i2s(struct unit_test_state *uts)
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| {
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| 	struct udevice *dev;
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| 	u8 data[3];
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| 
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| 	/* check probe success */
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| 	ut_assertok(uclass_first_device_err(UCLASS_I2S, &dev));
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| 	data[0] = 1;
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| 	data[1] = 4;
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| 	data[2] = 6;
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| 	ut_assertok(i2s_tx_data(dev, data, ARRAY_SIZE(data)));
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| 	ut_asserteq(11, sandbox_get_i2s_sum(dev));
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| 	ut_assertok(i2s_tx_data(dev, data, 1));
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| 	ut_asserteq(12, sandbox_get_i2s_sum(dev));
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| 
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| 	return 0;
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| }
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| DM_TEST(dm_test_i2s, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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