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dm: core: Fix uclass_probe_all to really probe all devices

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uclass_probe_all uses uclass_first_device/uclass_next_device assigning
the return value.

The interface for getting meaningful error is
uclass_first_device_check/uclass_next_device_check, use it.

Also do not stop iteration when an error is encountered. Probing all
devices includes those that happen to be after a failing device in the
uclass order.

Fixes: a59153dfeb ("dm: core: add function uclass_probe_all() to probe all devices")
Signed-off-by: Michal Suchanek <msuchanek@suse.de>
Reviewed-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Michal Suchanek 2022-10-12 21:57:50 +02:00 committed by Simon Glass
parent e21ec17d42
commit dfecd63192
2 changed files with 20 additions and 11 deletions
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12
drivers/core/uclass.c
View File

@ -799,20 +799,18 @@ int uclass_pre_remove_device(struct udevice *dev)
int uclass_probe_all(enum uclass_id id) int uclass_probe_all(enum uclass_id id)
{ {
struct udevice *dev; struct udevice *dev;
int ret; int ret, err;
ret = uclass_first_device(id, &dev); err = uclass_first_device_check(id, &dev);
if (ret || !dev)
return ret;
/* Scanning uclass to probe all devices */ /* Scanning uclass to probe all devices */
while (dev) { while (dev) {
ret = uclass_next_device(&dev); ret = uclass_next_device_check(&dev);
if (ret) if (ret)
return ret; err = ret;
} }
return 0; return err;
} }
int uclass_id_count(enum uclass_id id) int uclass_id_count(enum uclass_id id)

19
test/dm/test-fdt.c
View File

@ -392,10 +392,10 @@ DM_TEST(dm_test_fdt_offset,
UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_FLAT_TREE); UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_FLAT_TREE);
/** /**
* Test various error conditions with uclass_first_device() and * Test various error conditions with uclass_first_device(),
* uclass_next_device() * uclass_next_device(), and uclass_probe_all()
*/ */
static int dm_test_first_next_device(struct unit_test_state *uts) static int dm_test_first_next_device_probeall(struct unit_test_state *uts)
{ {
struct dm_testprobe_pdata *pdata; struct dm_testprobe_pdata *pdata;
struct udevice *dev, *parent = NULL; struct udevice *dev, *parent = NULL;
@ -428,9 +428,20 @@ static int dm_test_first_next_device(struct unit_test_state *uts)
device_remove(parent, DM_REMOVE_NORMAL); device_remove(parent, DM_REMOVE_NORMAL);
ut_asserteq(-ENOENT, uclass_first_device(UCLASS_TEST_PROBE, &dev)); ut_asserteq(-ENOENT, uclass_first_device(UCLASS_TEST_PROBE, &dev));
/* Now that broken devices are set up test probe_all */
device_remove(parent, DM_REMOVE_NORMAL);
/* There are broken devices so an error should be returned */
ut_assert(uclass_probe_all(UCLASS_TEST_PROBE) < 0);
/* but non-error device should be probed nonetheless */
ut_assertok(uclass_get_device(UCLASS_TEST_PROBE, 2, &dev));
ut_assert(dev_get_flags(dev) & DM_FLAG_ACTIVATED);
ut_assertok(uclass_get_device(UCLASS_TEST_PROBE, 3, &dev));
ut_assert(dev_get_flags(dev) & DM_FLAG_ACTIVATED);
return 0; return 0;
} }
DM_TEST(dm_test_first_next_device, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); DM_TEST(dm_test_first_next_device_probeall,
UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* Test iteration through devices in a uclass */ /* Test iteration through devices in a uclass */
static int dm_test_uclass_foreach(struct unit_test_state *uts) static int dm_test_uclass_foreach(struct unit_test_state *uts)