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dm: test: Add tests for get/find uclass devices
This commit introduces simple tests for functions:
- uclass_find_first_device()
- uclass_find_next_device()
- uclass_first_device()
- uclass_next_device()
Tests added by this commit:
- Test: dm_test_uclass_devices_find:
* call uclass_find_first_device(), then check if: (dev != NULL), (ret == 0)
* for the rest devices, call uclass_find_next_device() and do the same check
- Test: dm_test_uclass_devices_get:
* call uclass_first_device(), then check if:
-- (dev != NULL), (ret == 0), device_active()
* for the rest devices, call uclass_next_device() and do the same check
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Acked-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
parent
754e71e850
commit
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@ -656,9 +656,41 @@ static int dm_test_uclass_before_ready(struct dm_test_state *dms)
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return 0;
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return 0;
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}
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}
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DM_TEST(dm_test_uclass_before_ready, 0);
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DM_TEST(dm_test_uclass_before_ready, 0);
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static int dm_test_uclass_devices_find(struct dm_test_state *dms)
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{
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struct udevice *dev;
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int ret;
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for (ret = uclass_find_first_device(UCLASS_TEST, &dev);
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dev;
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ret = uclass_find_next_device(&dev)) {
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ut_assert(!ret);
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ut_assert(dev);
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}
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return 0;
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}
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DM_TEST(dm_test_uclass_devices_find, DM_TESTF_SCAN_PDATA);
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static int dm_test_uclass_devices_get(struct dm_test_state *dms)
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{
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struct udevice *dev;
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int ret;
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for (ret = uclass_first_device(UCLASS_TEST, &dev);
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dev;
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ret = uclass_next_device(&dev)) {
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ut_assert(!ret);
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ut_assert(dev);
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ut_assert(device_active(dev));
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}
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return 0;
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}
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DM_TEST(dm_test_uclass_devices_get, DM_TESTF_SCAN_PDATA);
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static int dm_test_device_get_uclass_id(struct dm_test_state *dms)
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static int dm_test_device_get_uclass_id(struct dm_test_state *dms)
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{
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{
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struct udevice *dev;
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struct udevice *dev;
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